Show simple item record

[working paper]

dc.contributor.authorBó, Ináciode
dc.contributor.authorHakimov, Rustamdjande
dc.date.accessioned2020-10-13T13:12:02Z
dc.date.available2020-10-13T13:12:02Z
dc.date.issued2016de
dc.identifier.urihttps://www.ssoar.info/ssoar/handle/document/70074
dc.description.abstractWe run laboratory experiments where subjects are matched to colleges, and colleges are not strategic agents. We test the Gale-Shapley Deferred Acceptance (DA) mechanism versus the Iterative Deferred Acceptance Mechanism (IDAM), a matching mechanism based on a new family of procedures being used in the field, in which information about tentative allocations is provided while students make choices. We consider two variations of IDAM: one in which they are only informed about whether they are tentatively accepted or not (IDAM-NC) and one in which students are additionally informed at each step of the tentative cutoff values for acceptance at each school (IDAM). A significantly higher proportion of stable outcomes is reached both under IDAM and IDAM-NC than under DA. The difference can be explained by a higher proportion of subjects following an equilibrium strategy akin to truthful behavior under IDAM and IDAM-NC than truthful behavior itself under DA. Moreover, the provision of intermediate cutoff values in IDAM leads to higher rates of equilibrium behavior than in IDAM-NC and a higher robustness of stability between the rounds of experiments. Our findings provide substantial support for the rising practice of using iterative mechanisms in centralized college admissions in practice.de
dc.languageende
dc.subject.ddcSozialwissenschaften, Soziologiede
dc.subject.ddcSocial sciences, sociology, anthropologyen
dc.subject.ddcBildung und Erziehungde
dc.subject.ddcEducationen
dc.subject.otherCollege Admissions; Iterative Mechanisms; Matchingde
dc.titleIterative versus standard deferred acceptance: experimental evidencede
dc.description.reviewbegutachtetde
dc.description.reviewrevieweden
dc.source.volumeSP II 2016-209de
dc.publisher.countryDEU
dc.publisher.cityBerlinde
dc.source.seriesDiscussion Papers / Wissenschaftszentrum Berlin für Sozialforschung, Forschungsschwerpunkt Markt und Entscheidung, Abteilung Verhalten auf Märkten
dc.subject.classozMakroebene des Bildungswesensde
dc.subject.classozErhebungstechniken und Analysetechniken der Sozialwissenschaftende
dc.subject.classozMacroanalysis of the Education System, Economics of Education, Educational Policyen
dc.subject.classozMethods and Techniques of Data Collection and Data Analysis, Statistical Methods, Computer Methodsen
dc.subject.thesozdesignen
dc.subject.thesozLaborexperimentde
dc.subject.thesozmarketen
dc.subject.thesozlaboratory experimenten
dc.subject.thesozDesignde
dc.subject.thesozHochschulzugangde
dc.subject.thesozMarktde
dc.subject.thesozuniversity admissionen
dc.rights.licenceDeposit Licence - Keine Weiterverbreitung, keine Bearbeitungde
dc.rights.licenceDeposit Licence - No Redistribution, No Modificationsen
ssoar.contributor.institutionWZBde
internal.statusformal und inhaltlich fertig erschlossende
internal.identifier.thesoz10043016
internal.identifier.thesoz10040773
internal.identifier.thesoz10046740
internal.identifier.thesoz10034440
dc.type.stockmonographde
dc.type.documentArbeitspapierde
dc.type.documentworking paperen
dc.source.pageinfo38de
internal.identifier.classoz10105
internal.identifier.classoz10603
internal.identifier.document3
dc.contributor.corporateeditorWissenschaftszentrum Berlin für Sozialforschung gGmbH
internal.identifier.corporateeditor381
internal.identifier.ddc370
internal.identifier.ddc300
dc.description.pubstatusPublished Versionen
dc.description.pubstatusVeröffentlichungsversionde
internal.identifier.licence3
internal.identifier.pubstatus1
internal.identifier.review2
internal.identifier.series961
internal.dda.referencehttps://www.econstor.eu/oai/request@@oai:econstor.eu:10419/148566
dc.identifier.handlehttp://hdl.handle.net/10419/148566de
ssoar.urn.registrationfalsede


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record