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The Relative Size of Measurement Error and Attrition Error in a Panel Survey: Comparing Them With New Multi-Trait Multi-Method Model
[journal article]
Abstract This paper proposes a method to simultaneously estimate both measurement and nonresponse errors for attitudinal and behavioural questions. The method uses a Multi-Trait Multi-Method (MTMM) approach, which is commonly used to estimate the reliability and validity of survey questions. The classic MTMM... view more
This paper proposes a method to simultaneously estimate both measurement and nonresponse errors for attitudinal and behavioural questions. The method uses a Multi-Trait Multi-Method (MTMM) approach, which is commonly used to estimate the reliability and validity of survey questions. The classic MTMM model is in this paper extended to include the effects of measurement bias and longitudinal nonresponse. Measurement and nonresponse errors are expressed on a common metric in this model, so that their relative sizes can be assessed over the course of a panel study. Using an example about political trust from the Dutch LISS panel, we show that measurement problems lead to both small errors and small biases, that dropout in the panel study does not lead to errors or bias, and that therefore, measurement is a more important source of both error and bias than nonresponse.... view less
Keywords
panel; questionnaire; data quality; validity; attitude research; response behavior; survey research; data capture; reliability
Classification
Methods and Techniques of Data Collection and Data Analysis, Statistical Methods, Computer Methods
Free Keywords
trade-off between nonresponse and measurement; MTMM; total survey error
Document language
English
Publication Year
2017
Page/Pages
p. 369-382
Journal
Survey Research Methods, 11 (2017) 4
ISSN
1864-3361
Status
Published Version; peer reviewed
Licence
Deposit Licence - No Redistribution, No Modifications